Mobilization of LINE-1 retrotransposons is restricted by Tex19.1 in mouse embryonic stem cells

…, C Salvador-Palomeque, AR Mann, P Peressini… - Elife, 2017 - elifesciences.org
10.7554/eLife.26152.001 Mobilization of retrotransposons to new genomic locations is a
significant driver of mammalian genome evolution, but these mutagenic events can also cause …

Study of an Impurity Mode Using Specific-Heat Measurements

JP Harrison, PP Peressini, RO Pohl - Physical Review, 1968 - APS
… With the Lorentz local 6eld correction, Ei„=-',(~/co+2)E,»i, where p/ep ——4.Ref. 6), this value
… We may, therefore, use the value of p, determined from the electrocaloric work to compute …

Diffusion coefficient and electromigration velocity of copper in thin silver films

G DiGiacomo, P Peressini, R Rutledge - Journal of Applied Physics, 1974 - pubs.aip.org
The objective of this work was to determine the Cu diffusion coefficient in silver thin films as
a function of temperature, and Cu electromigration velocity as a function of electric current …

Low-Temperature Specific Heat of KCl: OH

PP Peressini, JP Harrison, RO Pohl - Physical Review, 1969 - APS
p, respectively, using a Cary 14 and a PerkinElmer 521 recording spectrophotometer. … from
CN P YVith increasing concentration, random internal stress will build up in the crystal. This …

Rotational Degrees of Freedom of Molecules in Solids. III. Thermal Properties of RbCl: CN

JP Harrison, PP Peressini, RO Pohl - Physical Review, 1968 - APS
The thermal conductivity and the specific heat of RbCl containing RbCN in concentrations
between 10 17 and 10 19 cm− 3 in solid solution has been measured above 0.05 K. …

Thermal Conductivity of KCl: Li. Isotope and Electric Field Effects

PP Peressini, JP Harrison, RO Pohl - Physical Review, 1969 - APS
The resonance scattering of phonons in KCl: Li has been studied through thermal-conductivity
measurements of crystals containing Li 6 and Li 7, and also of crystals in which the …

Electromigration-induced failures in thin-film Al-Cu conductors

BN Agarwala, L Berenbaum, P Peressini - Journal of Electronic Materials, 1974 - Springer
The effect of CuAl 2 precipitates on the electromigration lifetime of thin film Al-Cu conductors
was studied by varying the Cu concentration in the 0–12 wt per cent range. Experiments …

Low‐Temperature Specific Heat of RbCl, RbBr, and RbI

RJ Rollefson, PP Peressini - Journal of Applied Physics, 1972 - pubs.aip.org
The specific heats of RbCI, RbBr, and RbI have been measured between 0.10 and 13 OK.
The Debye temperatures calculated from the specifiC heats have low temperature limits of …

Design of short-channel ion-implanted MOSFETs with relatively deep junctions

WS Johnson, PP Peressini… - … Electron Devices Meeting …, 1974 - ieeexplore.ieee.org
This paper discusses design considerations for short-channel ion-implanted MOSFET
devices with relatively deep junctions. Four device parameters are considered: threshold and …

Width dependence of electromigration life in al-cu al-cu-si, and ag conductors

…, BN Agarwala, PP Peressini… - 13th International …, 1975 - ieeexplore.ieee.org
The electromigration lifetimes of thin-film Al-Cu, Al-Cu-Si, and Ag conductors were measured
as a function of stripe width. Both the median lifetime and the standard deviation of the …